The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 11, 1994

Filed:

Dec. 17, 1992
Applicant:
Inventors:

Joachim Feldman, Neustadt, DE;

Axel Stender, Hameln, DE;

Assignee:

Wabco Standard GmbH, Hanover, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
73768 ; 73784 ; 73779 ;
Abstract

A device for measuring the deformation of a structural component comprises a sensor installed at a first end of a hollow bore in the structural component, the sensor having a measuring surface and producing an electrical signal indicative of a deformation in the measuring surface, and a transmission element which passes through the hollow bore. The transmission element has a first end which is supported by the structural component, and a second end which bears upon the measuring surface of the sensor, so that a deformation which occurs in the structural component will be transmitted to the measuring surface by the transmission element.


Find Patent Forward Citations

Feldman, Joachim. (1994). Device to measure the deformation of a structural component (U.S. Patent No. 5353645). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5353645

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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