The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 04, 1994

Filed:

Jun. 29, 1992
Applicant:
Inventors:

Richard M Waugh, Chester, VA (US);

Robert J Maher, Midlothian, VA (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K / ; H04N / ;
U.S. Cl.
CPC ...
382-8 ; 382-1 ; 348 92 ; 348130 ; 348142 ;
Abstract

A product gauge is disclosed for use in the optical inspection of products. The product gauge can be produced from the image of a model of the product. The product gauge can also be electronically constructed on a video screen by a computer line-drawing program. The product gauge aids in the alignment and the processing of information by the optical inspecting means including aiding an operator in determining whether a product is acceptable. The product gauge can be used to quickly and accurately tailor a generalized product inspection apparatus to specific products and thus ease the change from inspecting one product to another product.


Find Patent Forward Citations

Waugh, Richard. (1994). Product gauge methods and apparatus for use in the optical determination (U.S. Patent No. 5353356). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5353356

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…