The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 04, 1994

Filed:

Jan. 24, 1992
Applicant:
Inventors:

Yoichi Takagi, Hitachi, JP;

Masayasu Kato, Hitachi, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K / ; G06F / ; G01N / ;
U.S. Cl.
CPC ...
382-8 ; 364470 ; 356238 ;
Abstract

A device for recognizing and matching fabric pattern-forms for cutting is constituted by a marking CAD, a pattern-match control computer, a pattern recognition device body, a camera, a monitor and console, a mouse, a camera positioning robot, a cutter, a camera and video signal changeover mechanism, an iris controller, a pattern-match and cutting table, and so on. In the marking CAD, information concerning cutting point sequence data and pattern-matching points is generated and transferred to the control computer. The pattern-matching control computer moves the camera above each of the pattern-matching points to fetch an image to thereby measure the pattern position. The cutting point sequence data are revised on the basis of the result of the measurement. When poor recognition or erroneous-recognition occurs in the pattern recognition based on the image, the pattern position is determined manually through the monitor and console and the mouse.


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