The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 04, 1994
Filed:
May. 10, 1991
Akio Suzuki, Yokohama, JP;
Toshimitsu Danzuka, Tokyo, JP;
Haruhiko Moriguchi, Yokohama, JP;
Yoshihiro Takada, Kawasaki, JP;
Yasushi Miura, Kawasaki, JP;
Hisashi Fukushima, Yokohama, JP;
Masami Izumizaki, Tokyo, JP;
Nobuhiko Takekoshi, Yokohama, JP;
Nobuyuki Watanabe, Yokohama, JP;
Eiichi Takagi, Yokohama, JP;
Haruhiko Takahashi, Yokohama, JP;
Canon Kabushiki Kaisha, Tokyo, JP;
Abstract
A correction data production apparatus includes a detecting unit for reading a test pattern formed by a recording head having a plurality of recording elements constituting an array, and for detecting a density distribution of a range of the array of the plurality of recording elements, a corresponding unit for causing the density distribution detected by the detecting unit to correspond to the plurality of recording elements on the basis of a reference position where a density of an end portion of the density distribution reaches a predetermined threshold value, a production unit for producing correction data for an image formation density uniforming drive conditions in correspondence with the plurality of recording elements on the basis of the density distribution corresponded by the corresponding unit, and a changing unit for changing the threshold value in accordance with characteristics of the test pattern.