The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 04, 1994

Filed:

Jan. 26, 1993
Applicant:
Inventors:

Alex Mordehai, Ithaca, NY (US);

Gerard Hopfgartner, Ithaca, NY (US);

John D Henion, Trumansburg, NY (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B01D / ; H01J / ;
U.S. Cl.
CPC ...
250288 ; 250292 ;
Abstract

A novel atmospheric pressure ionization device for the transport of charged particle produced by at atmospheric pressure to a mass analyzer includes a liquid shield between the particle source and the sample inlet into the mass analyzer. The liquid shield may be in the form of a disk with a central aperture and acts as a spray splitter and aerofocusing device which increases the flow rate of a liquid sample into the analyzer. The mass analyzer is located in a high vacuum region and an intermediate low vacuum region is provided between the sample inlet and the analyzer. An ion optical system includes electrostatic lens assemblies in said vacuum regions for transporting charged particles from the inlet to the analyzer.


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