The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 04, 1994

Filed:

Jun. 11, 1992
Applicant:
Inventors:

Michael A Resnick, Chapel Hill, NC (US);

Torston Nilsson-Tillgren, Copenhagen, DK;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
C12Q / ;
U.S. Cl.
CPC ...
435-6 ; 4352551 ; 4352552 ; 435941 ; 435942 ;
Abstract

A sensitive, yeast-based genetic system for identifying agents causing double-strand DNA damage is described. The system comprises a yeast strain containing either chromosomes having divergent (homeologous) DNA sequences, a single nonhomologous chromosome or a single artificial chromosome with suitable genetic markers so that double-strand damage leading to the loss of such chromosome due to the inability to undergo recombinational repair with a homolog is detected.


Find Patent Forward Citations

Resnick, Michael. (1994). Sensitive yeast genetic system for identifying agents causing (U.S. Patent No. 5352581). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5352581

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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