The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 04, 1994
Filed:
Nov. 18, 1991
Applicant:
Inventors:
Assignee:
Olympus Optical Co., Ltd, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
73588 ; 73602 ; 73609 ; 73613 ;
Abstract
A measuring apparatus using an ultrasonic wave according to the invention transmits an ultrasonic wave pulse into a specimen, receives the echo reflected by the specimen and converts it into an electric signal. The components of the electric signal that represent the wave reflected by the specimen and contain data on the state of the specimen are extracted by a gate circuit. The components obtained by the gate circuit are converted into a power spectrum by a circuit for performing a Fourier transformation. The thickness of the specimen and/or the flaking state of the specimen can be determined from this power spectrum.