The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 27, 1994
Filed:
Dec. 06, 1993
Jon J Kaminer, Richmond, VA (US);
Gary F Nevers, Lynn, MA (US);
Edgar V Sellers, Wilmington, NC (US);
E. I. Du Pont de Nemours and Company, Wilmington, DE (US);
Abstract
A method and apparatus to non-destructively inspect and quantify yarn crimp characteristics either off-line or on-line at speeds in excess of 2,000 yds./min. by acquiring images of yarn crimp on-line during the manufacturing process, then digitizing the images of yarn crimp and performing all data processing from the digital data required. Each image is segregated into features (e.g. valid crimp, low frequency oscillations, high frequency oscillations, edge oscillations, and unconfirmed oscillations with each parameter being analyzed separately. Features are segmented two dimensionally using techniques such as, but not limited to, local max/min intensity profiles and spatial intensity and frequency thresholding. Regions identified as abnormal are separated from areas of valid crimp before determining crimp frequency. Outputs of individual analysis are combined to determine global tow quality. This method provides a complete statistical analysis for each lane in the tow as well as the overall tow width. Software analysis allows operator interaction if desired.