The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 27, 1994
Filed:
Mar. 09, 1993
Hiroya Koshishiba, Yokohama, JP;
Mihoko Yoshimura, Kamakura, JP;
Hitachi, Ltd., Tokyo, JP;
Abstract
This invention relates to an X-ray tomography apparatus and a method therefor. The apparatus comprises an X-ray source for irradiating X rays to an inspection object; inspection object an rotating arrangement for rotating the inspection object about a first rotational axis slanted to an, optical axis of X rays generated from the X-ray source; and an X-ray detecting arrangement where an X-ray image transmitted through the inspection object rotated by the inspection object rotating arrangement is rotated and superposed in synchronization with the inspection object rotated about second rotational axis in parallel to the first rotational axis, and the X-ray projection image outside of a focal plane perpendicular to the first rotational axis passing through an intersection of the optical axis and the first rotational axis is blurred and the X-ray tomographic image in the focal plane is detected as a clear image signal, thereby the X-ray tomographic image in the focal plane can be obtained based on the image signal obtained from the X-ray detecting arrangement.