The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 27, 1994

Filed:

Oct. 22, 1992
Applicant:
Inventors:

Tadashi Takeda, Nagano, JP;

Hiroyuki Wada, Tokyo, JP;

Kenji Fukui, Tokyo, JP;

Ricardo M Okamoto, Tokyo, JP;

Shohei Hashiguchi, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11B / ; G11B / ;
U.S. Cl.
CPC ...
369112 ; 369 4423 ; 369 4414 ;
Abstract

This invention pertains to a displacement detecting device for an optical head for detecting focal point displacement of irradiation light. The displacement detecting device has optical means for converting reflected rays from an irradiated face into an astigmatic bundle of rays and a photodetector for detecting a change in the the focused shape. The displacement detecting device thus detects focal point displacement of irradiation light. The optical means is obtained by integrally forming a plurality of Fresnel zone plates having rectilinear gratings, focusing reflected rays from the irradiated face, and having different focal lengths.


Find Patent Forward Citations

Takeda, Tadashi. (1994). Optical information system focal point displacement detecting means (U.S. Patent No. 5351230). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5351230

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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