The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 27, 1994
Filed:
Jun. 16, 1992
Takehiro Nakatsue, Kanagawa, JP;
Asahi Kogaku Kogyo Kabushiki Kaisha, Tokyo, JP;
Abstract
A method for measuring an anamorphic lens includes a first step of converging a light beam emitted by a light source towards a reference standard and adjusting the reference standard along the travel direction of the light beam so that the light beam reflected by the reference standard forms a point spread function image or a line spread function image on a focal plane. A second step of replacing the reference standard with an anamorphic lends to be measured and adjusting the same so that the light beam reflected by the anamorphic lens forms a line spread function image on the focal plane, and a third step of measuring the anamorphic by comparing the first step with the second step are provided.