The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 27, 1994

Filed:

Mar. 23, 1993
Applicant:
Inventors:

Rintaro Nakane, Yokohama, JP;

Jiro Egawa, Yokosuka, JP;

Assignee:

Kabushiki Kaisha Toshiba, Kawasaki, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G03G / ;
U.S. Cl.
CPC ...
355208 ; 355246 ; 346160 ;
Abstract

High and low density test patterns are formed from pattern generating unit as toner patterns on a photosensitive drum, and attached toner amounts corresponding to the test patterns are detected by toner density detecting unit under the control of a control circuit which calculates the differences between the attached toner amounts of the high and low density portions and respective target values, wherein, when the calculated differences do not fall within respective predetermined ranges, the exposure conditions of an optical system and the bias voltage of a developing unit, or the exposure amount of the optical system and the bias voltages of a charger and the developing unit, or the bias voltages of the charger and the developing unit and the light-emission period of the optical system are renewed.


Find Patent Forward Citations

Loading…