The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 27, 1994
Filed:
Nov. 30, 1992
Abstract
An expert system for retrieving molding conditions, in which a statistical technique is added to the functions of the conventional expert system, causes of defects are inferred from the records of countermeasures taken and inputted defect occurrence situation, conditions for temporary molding are obtained while repeating test molding, qualitative defects are extracted from defects occurred, a boundary of a region in which defects occur is determined with decision analysis of qualitative defects extracted with the use of the record of countermeasures as above, a condition for molding to eliminate the qualitative defects is determined on the basis of the boundary of region of defects occurrence, quantitative defects are extracted from defects occurred, and molding conditions for eliminating the quantitative defects are determined by performing analysis of variance depending on design of experiment with the quantitative defects extracted from the record of countermeasures, whereby the frequency of experiment is greatly reduced in executing statistical technique, countermeasures to a plurality of defects causing mutual actions are taken readily, and reliability of molding conditions to be obtained is increased.