The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 27, 1994
Filed:
Mar. 19, 1993
Yoshitoshi Ito, Ome, JP;
Fumio Kawaguchi, Hinode, JP;
Yukito Shinohara, Tokyo, JP;
Munetaka Haida, Isehara, JP;
Hitachi, Ltd., Tokyo, JP;
Tokai University, Tokyo, JP;
Abstract
A device for measuring the inside information of a light-scattering specimen using a Line Spread Function (LSF) function of a light-scattering specimen and the intensity distribution of light which is transmitted through the light scattering specimen in repeating light scattering and output from the light scattering specimen. The device comprises: an optical system for illumination for irradiating a specimen to be measured (a light scattering specimen); an optical system for detection for detecting the transmitted light through the specimen; and a data processor for operating the detected transmitted light data. The above-mentioned data processor operates the inside information of a specimen to be measured based on the light intensity distribution of the transmitted light through the specimen and an LSF function which is newly defined, and displays the inside information as a tomograph image.