The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 20, 1994

Filed:

May. 10, 1993
Applicant:
Inventors:

Rodney J Dallaire, Livonia, MI (US);

Herbert C Stankwitz, Ann Arbor, MI (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S / ;
U.S. Cl.
CPC ...
342195 ; 342196 ;
Abstract

Spatially variant apodization is a digital image processing technique for eliminating sidelobes produced by Fourier transform of finite data sequences without compromising mainlobe width. This process allows each sample or pixel in an image to receive its own frequency domain aperture amplitude weighting function from an infinite number of possible weighting functions. In its simplest form the weight is a function of the negative of the current sample divided by the sum of the neighboring samples, and the function is limited to a predetermined range such as the range between zero and one half.


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