The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 20, 1994

Filed:

Jun. 25, 1993
Applicant:
Inventor:

Marcus H Mendenhall, Nashville, TN (US);

Assignee:

Vanderbilt University, Nashville, TN (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01J / ; H01J / ;
U.S. Cl.
CPC ...
250287 ; 250305 ; 250397 ;
Abstract

A microchannel plate detector device is intended for use in the detection of low energy electrons and negative ions in particle time-of-flight measurement systems. A vacuum isolator isolates the microchannel plate signal output from ground as well as from the vacuum chamber of the meaurement system. A coupling unit includes a pulse isolator for separating pulse signals from the microchannel plate DC bias voltage. Electronic circuitry matches the output impedance of the coupling unit to the input impedance of the measurement system signal processor, thereby minimizing reflection and distortion of high frequency pulse signals.


Find Patent Forward Citations

Mendenhall, Marcus. (1994). High resolution detector device for a particle time-of-flight (U.S. Patent No. 5349185). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5349185

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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