The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 20, 1994
Filed:
Sep. 04, 1992
Masaaki Terashima, Saitama, JP;
Hajime Makiuchi, Saitama, JP;
Fuji Photo Film Co., Ltd., Kanagawa, JP;
Abstract
An improved calibration method for calibrating the measured value of an analyte in a liquid sample by referring to a calibration curve drawn by plotting the interrelation between the calibration values of n (n is an integer of not less than 2) calibrators containing different contents of the analyte and the measured values of the analyte contained in respective calibrators. In the improved method provided by the invention, the function of the calibration curve is determined by a first step of estimating an imaginal point, the imaginal point either corresponding to a calibration value larger than the uppermost value of the n calibrators and vicinal to the upper limit of the determination range of the analyte or corresponding to a calibration value smaller than the lowermost value of the n calibrators and vicinal to the lower limit of the determination range of the analyte or a calibration value vicinal to the zero value, and a second step of determining the function of the calibration curve by plotting the imaginal point with two to n measured values.