The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 13, 1994

Filed:

Jun. 11, 1993
Applicant:
Inventors:

Naoki Isogai, Nishio, JP;

Hirohiko Hanaki, Gamagori, JP;

Assignee:

Nidek Co., Ltd., Aichi, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B / ; G03B / ;
U.S. Cl.
CPC ...
354 62 ; 351208 ; 351211 ; 351214 ; 351221 ;
Abstract

Ophthalmic photographing apparatus for photographing an anterior part of examinee's eye provides an alignment optical system including a reflection image forming device for forming an image reflected on the cornea of the examinee's eye, an observation optical system for observing image of the anterior part of the examinee's eye, comprising an alignment reticle, and a photographing optical system for photographing the anterior part of the examinee's eye. The picture image data of the anterior part of the eye photographed with the photographing optical system is memorized by a picture image data memory, and an alignment deviation is detected by operating the memorized picture image signal to detect a designated part and by finding a dislocation distance of the designated part from a reference position, and an analyzing position of the image is corrected on the basis of the alignment deviation and the picture image of the anterior eye is analyzed.


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