The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 06, 1994
Filed:
Oct. 23, 1992
Hideki Wakamatsu, Kobeshi, JP;
Hewlett-Packard Company, Palo Alto, CA (US);
Abstract
A system for measuring a broad range of impedance values with high precision and over a broad frequency band. Both the broadrange impedance measurement capability of the V-I method and the broadband frequency measuring capability of the reflection coefficient method are provided. A remote measurement capability is also available. Based upon the V-I method, a selection is made between a circuit to achieve an ideal open and a circuit to achieve an ideal short circuit in response to the impedance values. A boundary for selecting the impedance is, for instance, 50.OMEGA.. To measure a high impedance, the ideal open type circuit is selected; to measure a low impedance, the ideal short circuit is selected. The source and measuring instruments are extended by a coaxial cable. A floating measuring instrument is obtained by using a balun. Impedance measurements for 1 MHz to 2 GHz are possible.