The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 06, 1994

Filed:

Nov. 06, 1991
Applicant:
Inventor:

Mahesh C Reddy, Renton, WA (US);

Assignee:

The Boeing Company, Seattle, WA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01D / ;
U.S. Cl.
CPC ...
25023113 ; 250226 ; 25022723 ;
Abstract

A technique is disclosed for optically trimming a sensor (10) to account for manufacturing variations in the losses of the sensor. As a result, the sensor can be used interchangeably, without requiring adjustment of the processing system (12) the sensor is used with. More particularly, in one embodiment, variably transmissive optical filters 72 and 74 are positioned inside the sensor to effectively alter or standardize the losses of the sensor. Various other arrangements, including the use of variably reflective mirrors, wavelength selective elements, blocking elements, and path adjustment elements, are also described in which the characteristics of the sensor's optical paths are altered.


Find Patent Forward Citations

Reddy, Mahesh. (1994). Optically trimmed sensor for reducing influence of differential node (U.S. Patent No. 5345076). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5345076

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…