The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 06, 1994

Filed:

Mar. 05, 1993
Applicant:
Inventor:

Yuichi Sugiyama, Kawasaki, JP;

Assignee:

Fujitsu Limited, Kawasaki, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B / ;
U.S. Cl.
CPC ...
12866101 ; 73626 ;
Abstract

The present invention relates to an improvement of a delay control circuit of an ultrasonic diagnostic apparatus and is intended to provide a circuit configuration capable of utilizing a cyclicity of combination of signal lines, to absorb variations of a delay amount in accordance with a probe frequency by changing over a plurality of input ports corresponding to the frequencies of the probe which are provided for each of partial assemblies (delay control blocks) of delay lines at an input part of each assembly (delay control block), to confine crossings of signal lines within the partial assemblies of delay lines (delay control blocks) and to allow connection between partial assemblies of delay lines (delay control blocks) with a single signal line.


Find Patent Forward Citations

Sugiyama, Yuichi. (1994). Ultrasonic diagnostic apparatus (U.S. Patent No. 5343864). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5343864

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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