The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 30, 1994

Filed:

Feb. 04, 1993
Applicant:
Inventor:

Ake A Hellstrom, Columbus, OH (US);

Assignee:

ABB Process Automation Inc., Columbus, OH (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ; G01N / ;
U.S. Cl.
CPC ...
356431 ; 356436 ;
Abstract

An apparatus for optically scanning and measuring the physical parameters of a sheet material by means which are fully enclosed within an air purged cross-machine box-beam structure to protect the radiation source, the radiation detector and the optics from the harsh machine environment. The apparatus may involve a single beam enclosing a combined source/detector module for reflection measurement or dual beams on opposite sides of the sheet for transmission measurement with one enclosing a source module and the other enclosing a detector module. Standardization means are also provided either in the module itself or as an extension of the beam. Means are also disclosed for sealing the opening in the beams through which the radiation passes.


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