The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 23, 1994
Filed:
Feb. 22, 1993
Norbert Conrads, Hauset, BE;
Walter Hillen, Aachen, DE;
Hanns-Ingo Maack, Norderstedt, DE;
Stephan Rupp, Stuttgart, DE;
Ingo Schafer, Kiel, DE;
Ulrich Schiebel, Aachen, DE;
U.S. Philips Corporation, New York, NY (US);
Abstract
The invention relates to a method of generating X-ray images by means of a photoconductor which is provided on a conductive substrate and whose surface potential can be read by means of probes, and also relates to a device suitable for carrying out the method. In order to avoid image artefacts which could be caused by deviating sensitivities of the probes or by frequency-dependent distortions, after the charging of the photoconductor the substrate potential is varied during a test phase. Test data is generated which correspond to the spatial or temporal variation of the potential on the surface of the photoconductor; from this test data there is formed correction data which is stored in order to correct the image data of a subsequent X-ray exposure.