The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 23, 1994

Filed:

Sep. 02, 1992
Applicant:
Inventors:

Robert Bencivenga, Somerville, NJ (US);

Scott Davidson, Pennington, NJ (US);

Victor J Velasco, Montgomery, NJ (US);

Assignee:

AT&T Bell Laboratories, Murray Hill, NJ (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R / ; G06G / ;
U.S. Cl.
CPC ...
364578 ; 371 23 ; 371 251 ; 371 681 ;
Abstract

A test (i.e., a set of test vectors) for differentiating between two different integrated circuit versions (12,14) is established by first modeling the circuits in a simulated system such that: (a) the corresponding inputs of the circuits are coupled in parallel, (b) the corresponding outputs of the circuits are exclusively OR'd by a separate one of a plurality of exclusive OR gates (18.sub.1,18.sub.2,18.sub.3 . . . 18.sub.m), and (c) the outputs of the exclusive OR gates are OR'd by an OR gate (20). Thereafter, a set of test vectors is generated, using conventional techniques, such that the vectors, when input to the different-version integrated circuits, cause a predetermined logic level signal to the OR gate (20).


Find Patent Forward Citations

Bencivenga, Robert. (1994). Method for generating a test to detect differences between integrated (U.S. Patent No. 5341314). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5341314

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