The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 23, 1994

Filed:

Jul. 16, 1992
Applicant:
Inventor:

Jacob Y Wong, Santa Barbara, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
250343 ; 2503385 ; 356437 ;
Abstract

The improved sample chamber includes an elongated hollow tube closed at one end and having specularly-reflective inwardly facing surfaces. A source of radiation and a detector of radiation are mounted side by side in the open end of the hollow tube, both facing the closed end. A plurality of filtering apertures are formed in the tube, and each aperture is covered by a sheet of a semipermeable membrane that serves to prevent airborne particles larger than a predetermined size from entering the chamber while not interfering with the free diffusion of the gas to be measured into and out of the chamber. The use of an elongated hollow tube that is closed at one end results in no loss in the efficiency with which the radiation is conducted from the source to the detector while decreasing the external length of the chamber by 50 percent.


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