The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 23, 1994

Filed:

Jun. 07, 1991
Applicant:
Inventors:

Rudolf E Slovacek, Norfolk, MA (US);

Walter F Love, Horseheads, NY (US);

Thomas A Cook, Corning, NY (US);

Richard L Schulkind, Sharon, MA (US);

Irene M Walczak, Boston, MA (US);

Assignee:

Ciba Corning Diagnostics Corp., Medfield, MA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
435-6 ; 422 57 ; 422 8205 ; 422 8207 ; 422 8208 ; 422 8211 ; 435174 ; 435176 ; 435182 ; 435291 ; 435808 ; 436164 ; 436172 ; 436518 ; 436527 ; 436805 ; 436807 ; 385 12 ; 385141 ; 385142 ; 385143 ;
Abstract

An evanescent wave sensor and method for use in analyzing one or more media, the sensor including a waveguide having first and second wave propagating surfaces. The waveguide propagates an input signal along the waveguide between the first and second surfaces. The first surface receives a first radiation signal which indicates the presence of a first analyte, and the second surface receives a second radiation signal representing one or both of a second analyte and a reference. The first and second surfaces can both be contacted with a single medium, or with two separate media, and one or more output signals can be detected.


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