The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 16, 1994
Filed:
Jan. 22, 1993
Applicant:
Inventors:
Kevin M Ovens, Garland, TX (US);
Jeffrey A Niehaus, Dallas, TX (US);
Assignee:
Texas Instruments Incorporated, Dallas, TX (US);
Primary Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
3241581 ; 324765 ; 324767 ; 371 225 ;
Abstract
A test circuit (10) is connected to a package pin of an integrated circuit via the first node (16). By setting the voltage on the package pin to a sufficient voltage, the test circuit becomes operable to measure DC characteristics of devices in the test circuit. The DC characteristics of the test circuit devices, such as resistors (26 and 34), diodes (44) and transistors (30 and 32) are used to estimate the AC characteristics of the actual integrated circuit. The AC characteristic estimations may be used to screen parts into various speed classes.