The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 16, 1994
Filed:
Jan. 28, 1993
Thomas E Jones, Spring Valley, CA (US);
Wayne C McGinnis, San Diego, CA (US);
The United States of America as represented by the Secretary of the Navy, Washington, DC (US);
Abstract
The present invention provides a method for determining the granular nature of superconductive materials and devices which includes the steps of: conducting a substantially rectangular current pulse through the superconductive material, maintaining the temperature of the superconductive material at a substantially constant temperature which does not exceed the critical temperature of the superconductive material; determining the amplitude of the current pulse; determining the electrical resistance, R, of the superconductive material resulting from conducting current pulse through the superconductive material; increasing the current until the electrical resistance of the superconductive material becomes saturated; determining the electrical resistance difference, .delta., between the electrical resistance, R, of the saturated superconductive material and a total normal state electrical resistance of the superconductive material; generating a first output signal if .vertline..delta..vertline..ltoreq..epsilon., where .epsilon. represents a predetermined limit, where the first output signal corresponds to the superconductive material having a homogenous microscopic morphology; and generating a second output signal if .vertline..delta..vertline.>.epsilon., where the second output signal corresponds to the superconductive material having a granular morphology. The method may also be used to determine the saturated electrical resistances of the superconductive sample.