The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 16, 1994
Filed:
Mar. 08, 1993
Grant T Gullberg, Salt Lake City, UT (US);
Hugh T Morgan, Highland Heights, OH (US);
Chi-Hua Tung, Salt Lake City, UT (US);
Gengsheng L Zeng, Salt Lake City, UT (US);
Paul E Christian, Salt Lake City, UT (US);
Other;
Abstract
A SPECT system includes three gamma camera heads (22a), (22b), (22c) which are mounted to a gantry (20) for rotation about a subject (12). The subject is injected with a source of emission radiation, which emission radiation is received by the camera heads. Transmission radiation from a transmission radiation source (30) is truncated to pass through a central portion of the subject but not peripheral portions and is received by one of the camera heads (22a) concurrently with the emission data. As the heads and radiation source rotate, the transmitted radiation passes through different parts or none of the peripheral portions at different angular orientations. An ultrasonic range arranger (152) measures an actual periphery of the subject. Attenuation properties of the subject are determined by reconstructing (90') the transmission data using an iterative approximation technique and the measured actual subject periphery. The actual periphery is used in the reconstruction process to reduce artifacts attributable to radiation truncation and the associated incomplete sampling of the peripheral portions. An emission reconstruction processor (112) reconstructs the emission projection data and attenuation properties into an attenuation corrected distribution of emission radiation sources in the subject.