The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 16, 1994
Filed:
Sep. 23, 1993
Jung H Kim, Seoul, KR;
Hyung S Kim, Kyungki, KR;
Byeong H Lee, Kyungki, KR;
Young H Roh, Kyungki, KR;
Hae Y Chung, Seoul, KR;
Goldstar Co., Ltd., , KR;
Abstract
Clothes quality determining apparatus and method capable of analyzing a sensing signal indicative of the quality of clothes to be washed in a washer, to determine whether the clothes quality signal is a clothes quality signal or a noise, and controlling a rotation force of the washer according to the determined clothes quality signal, thereby minimizing a damage of clothes. The apparatus includes a clothes quality sensing unit for sensing the quality of clothes from the magnitude of an impact generated by the clothes and generating a clothes quality signal, a correlation coefficient operating unit for analyzing the clothes quality signal outputted from the clothes quality sensing unit and outputting a correlation coefficient for determining whether the clothes quality signal is a meaningful signal or a noise, and a microprocessor for controlling a rotation speed of the washer according to the clothes quality signal, when the clothes quality signal currently inputted is determined to be the meaningful signal, from the correlation coefficient.