The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 09, 1994
Filed:
Oct. 19, 1992
Applicant:
Inventors:
Kenjiro Katsuragi, Tokyo, JP;
Akira Tanabe, Tokyo, JP;
Assignee:
Kabushiki Kaisha Topcon, Tokyo, JP;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B / ;
U.S. Cl.
CPC ...
351208 ; 351205 ;
Abstract
An ophthalmological instrument has an anterior portion observation system for observing the anterior portion of an eye to be tested. The anterior portion observation system includes focus position shifting means capable of properly focusing in at least two different portions of the eye.