The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 09, 1994
Filed:
Dec. 17, 1992
Kiyoshi Kamiya, Hamamatsu, JP;
Shigeru Uchiyama, Hamamatsu, JP;
Hideshi Ohishi, Hamamatsu, JP;
Norikazu Sugiyama, Hamamatsu, JP;
Yoshinori Mizuguchi, Hamamatsu, JP;
Masahiko Hirano, Hamamatsu, JP;
Hamamatsu Photonics K.K., Shizuoka, JP;
Abstract
A triple view imaging apparatus is provided for measuring quantitative distribution of material or property in a sample. In the triple view imaging apparatus, an optical system receives an original optical image of the sample, separates the original optical image into at least two secondary optical images having different optical properties from one another, and projects the at least two secondary optical images into a single view angle. A single video camera simultaneously picks up the thus projected plurality of secondary optical images as a single composite image and produces image signals representing the light intensities of the plurality of secondary optical images. An image processor receives the image signals and processes the image signals to obtain final image signals representing a relationship between the image signals for respective ones of the plurality of secondary optical images. An image display receives the calculated final image signals and displays a tertiary optical image based on the calculated final image signals which defines quantitative distribution of material or property in the sample.