The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 09, 1994
Filed:
Feb. 10, 1993
Thomas Chmielewski, Highland Heights, OH (US);
David A Molyneaux, Willowick, OH (US);
William O Braum, Twinsburg, OH (US);
Picker International, Inc., Highland Heights, OH (US);
Abstract
An RF device (A) under test is connected with ports or jacks (14, 16) of an S-parameter test set (B). An RF input jack (18) is connected with an RF tracking signal output (20) of a spectrum analyzer (C) to receive an RF tracking signal. An output jack (22) is connected with a receiver input (24) of the spectrum analyzer. A mode control (30) internal to the test set is controlled by a programmable control sequence generator (34) of the spectrum analyzer. The mode control controls a switch array (32), preferably PIN diodes, which interconnect the RF input jack (18), the RF output jack (22), the two jacks (14, 16) that are connected to the device under test, and a 50 Ohm termination (54) in four modes to make reflection measurements and two transmission measurements. DC bias jacks (26, 28) are connected with a DC power for injecting a DC component into the RF signals applied to the device under test.