The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 09, 1994
Filed:
Nov. 15, 1989
Applicant:
Inventors:
Brian L Kotzin, Denver, CO (US);
Philippa Marrack, Denver, CO (US);
John Kappler, Denver, CO (US);
Youngwon Choi, Denver, CO (US);
Assignee:
National Jewish Center for Immunology and Respiratory Medicine, Denver, CO (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C12Q / ; G01N / ;
U.S. Cl.
CPC ...
435-724 ; 435-6 ; 436501 ; 436548 ;
Abstract
The invention teaches a method for determining levels of T-cell surface antigens in humans, specifically, V.beta. molecules. Measurement of such levels allows for diagnosis of pathological conditions, such as infections, where changes in these levels are indicative of a superantigen initiated pathological condition.
Kotzin, Brian. (1994). Method for diagnosing a superantigen caused pathologial condition via (U.S. Patent No. 5336598). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5336598
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile