The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 09, 1994

Filed:

Mar. 29, 1993
Applicant:
Inventors:

Tadahiko Kozawa, Ibaragi, JP;

Yasuhiro Osakabe, Tokyo, JP;

Takashi Suematu, Tokyo, JP;

Assignee:

Hoya Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B / ;
U.S. Cl.
CPC ...
128-6 ; 128 22 ; 128 23 ; 362 32 ; 362138 ;
Abstract

An entoptoscopic instrument (10) comprises a light source unit (20), a light transmitting member (30), and a mirror member (40). The light source unit (20) comprises a filter for cutting off harmful wavelength components from illumination light to restrict the wavelength components of the illumination light to a range between 440 nm and 880 nm.


Find Patent Forward Citations

Kozawa, Tadahiko. (1994). Entoptoscopic instrument for observing the interior of an eye (U.S. Patent No. 5335648). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5335648

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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