The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 02, 1994
Filed:
May. 05, 1992
Asahi Kogaku Kogyo Kabushiki Kaisha, Tokyo, JP;
Abstract
A method and apparatus for lens measurement that provide for a small error of measurement where a light source used for measurement emits a beam of light at a wavelength different from an operating wavelength of a lens to be measured. The spherical aberration of the lens being measured, which occurs at the nonoperating wavelength, is identified and measured. An auxiliary lens is then placed in the path of the light source emitting the beam of light with the nonoperating wavelength to suppress the spherical aberration. This method allows for performance measurements of the lens to be obtained at the nonoperating wavelength without the adverse effects of the spherical aberration which occurred at the nonoperating wavelength.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile