Automatic kinescope bias arrangement

Abstract

An automatic kinescope bias (AKB) arrangement embodied in an integrated circuit (IC) includes circuitry for generating a timing signal during an AKB test interval, circuitry for generating a test signal in response to the timing signal, and circuitry including an output terminal for coupling the test signal to the kinescope. The AKB IC also includes an input terminal and a switching element coupled between the input terminal and the output terminal and responsive to the timing signal for selectively decoupling the input terminal from the output terminal. In a television system which includes a bias network which is coupled to the output of the video signal source and which inhibits the kinescope from being cutoff during the AKB test interval, the input terminal of the AKB IC is coupled to the output terminal of the video signal source. This allows the bias network to be decoupled from the display device during the AKB test interval, thereby preventing the bias network from affecting AKB operation. Alternatively, in a television system which does not include a bias network which inhibits the kinescope from being cutoff during the AKB test interval, the output terminal of the AKB IC is directly coupled to the output terminal of the video signal source.