The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 02, 1994
Filed:
Dec. 31, 1992
Applicant:
Inventor:
John R Viertl, Niskayuna, NY (US);
Assignee:
General Electric Company, Schenectady, NY (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ; G01N / ; G01B / ;
U.S. Cl.
CPC ...
324220 ; 324262 ;
Abstract
A method and apparatus for metal flaw detection using multiple eddy current probes contained in a single carriage. An interlaced scanning method allows the scanning line spacing to be narrower than the spacing between probes on the probe carriage. The probes are held at a constant lift-off distance from the surface by a probe carriage that slides across the surface in a straight scan line. The probe carriage moves relative to a motorized bracket that slides the carriage across the surface.