The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 02, 1994
Filed:
Jun. 10, 1992
Applicant:
Inventors:
Fred C Thomas, Kaysville, UT (US);
James Bero, Ogden, UT (US);
Robert Short, Ogden, UT (US);
Paul R Johnson, South Kaysville, UT (US);
Assignee:
Iomega Corporation, Roy, UT (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01D / ; G11B / ;
U.S. Cl.
CPC ...
250559 ; 250571 ; 356445 ; 369 13 ;
Abstract
An apparatus and method for etching a point on the surface of a magnetic medium to reduce the reflectivity of the point and for verifying that proper etching occurred. A light source provides a collimated incident beam of light. The incident beam is focused to a point on the medium and a portion of the beam is reflected. The reflected beam is separated from the incident beam and the intensity of the reflected beam is measured. The measured intensity is compared to a threshold value and verification is indicated if the measured intensity exceeds the threshold value.