The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 26, 1994

Filed:

Sep. 14, 1992
Applicant:
Inventor:

Mark R Rutenberg, Monsey, NY (US);

Assignee:

Neuromedical Systems, Inc., Monsey, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K / ;
U.S. Cl.
CPC ...
382-6 ; 382 10 ; 395155 ;
Abstract

A method of checking a process of individually inspecting successive sets of one or more images displayed on a screen, includes the steps of displaying at least one predetermined image having at least one area of interest for which inspection is to be performed, temporarily preventing a new set of at least one image from being displayed, recording each time that an event occurs at a predetermined location in such at least one image, and permitting a new set of at least one image to be displayed after the event has been recorded as having occurred at all predetermined areas of interest in the current display.


Find Patent Forward Citations

Rutenberg, Mark. (1994). Inspection apparatus and method with inspection auditing for images (U.S. Patent No. 5333207). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5333207

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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