The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 26, 1994

Filed:

Nov. 05, 1991
Applicant:
Inventors:

Pierre Grangeat, Saint Ismier, FR;

Patrick Le Masson, Villard de Lans, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
36441319 ;
Abstract

A process for reconstructing three-dimensional images of an object with the aid of measurements performed by bidimensional arrays of sensors on a succession of incidences around the object. There are at least two circular coaxial paths (2,2') on which the arrays (4,4') are displaced. Thus, it is possible either to accelerate the taking of images, or increase the volume of the measurements, or accelerate the calculation of the reconstructed image, through the use of a single reference frame in whose coordinates the sums of the measurements on each sensor are characterized. The process has particular application to medical imaging or to the non-destructive inspection of parts in emission or radiation attenuation tomography.


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