The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 26, 1994

Filed:

Mar. 19, 1992
Applicant:
Inventors:

Makoto Inaba, Hino, JP;

Masakazu Gotanda, Kanagawa, JP;

Hiromu Takahashi, Sendai, JP;

Takashi Nakamura, Sendai, JP;

Masatoshi Itoh, Sendai, JP;

Masaki Matsumoto, Sendai, JP;

Hiroshi Watabe, Sendai, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B / ;
U.S. Cl.
CPC ...
128659 ; 1286531 ; 128654 ; 250367 ; 250368 ;
Abstract

In a probe, two scintillators are arranged in tandem, the front end surfaces of two optical fibers transmitting the light emitted by the scintillators are connected to the rear of the scintillators and two photoelectric converters converting the light to pulse signals are connected to the rear of the optical fibers. A gate delay generator produces a gate signal from one pulse signal. A delay amplifier delays the other pulse signal. An M.C.A. will count up in case the pulse signal output by the delay amplifier is obtained during the gate signal.


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