The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 19, 1994

Filed:

Apr. 02, 1993
Applicant:
Inventors:

Satoru Oosawa, Tokyo, JP;

Motokazu Yamana, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G03B / ;
U.S. Cl.
CPC ...
354483 ; 354 79 ; 355 68 ; 355 71 ;
Abstract

A photomicrographic apparatus, which takes a picture of an enlarged image of a specimen observed under a microscope, causes filter insert/remove means to insert a light intensity-reducing filter in the photometric optical path to a light-receiving element when the light-receiving surface illuminance of the light-receiving element exceeds the upper limit of a first photometry enable illuminance range, and makes the filter insert/remove driving means remove the light intensity-reducing filter from the photometric optical path to the light-receiving element when the light-receiving surface illuminance of the light-receiving element drops below the lower limit of a second photometry enable illuminance range.


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