The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 19, 1994
Filed:
Sep. 11, 1991
Stephen Evanson, Garden Suburbs Oldham, GB;
Satoshi Kanno, Hitachi, JP;
Masahiro Otaka, Hitachi, JP;
Toshihiko Yoshimura, Tsuchiura, JP;
Kunio Hasegawa, Katsuta, JP;
Kazuo Takaku, Hitachi, JP;
Hitachi, Ltd., Tokyo, JP;
Abstract
A non-destructive inspection apparatus includes a magnetic field applying device and a magnetic sensor. The magnetic field applying device is adapted to apply DC and AC magnetic fields to an object to be inspected. Degradation/damage of the object is detected by measuring a magnetic characteristic of the object in a state in which the DC and AC magnetic fields are applied. Also, a non-destructive inspection apparatus includes as a magnetic sensor a plurality of pickup coils and a SQUID(s) connected to the pickup coils and decides the form of a defect of an object to be inspected by producing a difference between outputs of the pickup coils or SQUIDs.