The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 19, 1994

Filed:

Nov. 25, 1992
Applicant:
Inventors:

Kazumoto Tanaka, Hiroshima, JP;

Kazuo Hironaka, Hatsukaichi, JP;

Yoshimi Shimbara, Hiroshima, JP;

Assignee:

Mazda Motor Corporation, Hiroshima, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ; G01N / ; G01B / ;
U.S. Cl.
CPC ...
250372 ; 2503581 ; 356237 ;
Abstract

An inspection method including the steps of irradiating a light with a predetermined changing pattern onto a substantially specular surface to be inspected through an irradiation device facing the surface, forming an image based on reflected light in correspondence with the predetermined changing pattern by an imaging device, and utilizing reflected light of only 200-350 nm wavelength to form the image so as to detect a flaw in the surface by identifying points which differ from the changing pattern of the irradiation device. The flaws in the coating can be detected with a high accuracy irrespective of the color of the coating surface. An inspection device is also provided for the same object.


Find Patent Forward Citations

Tanaka, Kazumoto. (1994). Surface inspection method and device with irradiation (U.S. Patent No. 5331169). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5331169

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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