The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 12, 1994
Filed:
Oct. 22, 1992
Arturo A Rodriguez, Belmont, CA (US);
Mark A Pietras, Boynton Beach, FL (US);
Andres J Saenz, Belmont, CA (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method of quantitatively measuring fidelity of a reproduced image reconstructed from a compressed data representation of an original image is disclosed. The method comprises, responsive to user selection, for establishing a global assessment mode or a local assessment mode. In the global assessment mode changes in luminance of the reproduced image from the original image and changes in color in first and second color difference values of the reproduced image from the original image are used score fidelity. Changes in luminance are measured using a dynamic range, nonlinear transform equation. In the local assessment mode, and responsive to user selection, the reproduced image and the original image are segmented and corresponding pairs of segments from the reproduced image and the original image are identified. Scoring of fidelity of the reproduced image to the original image is done by comparing corresponding pairs of segments in color, luminance, shape, displacement and texture.