The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 12, 1994

Filed:

Jan. 28, 1992
Applicant:
Inventor:

Joseph L Horijon, Eindhoven, NL;

Assignee:

U.S. Philips Corporation, New York, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
356375 ; 356376 ;
Abstract

The height of a surface (21) is determined by measuring the position of a radiation spot (11) located on the surface (21). The radiation spot (11) is formed by a narrow incident beam (10). Radiation reflected in the radiation spot (11) is projected on two position-sensitive radiation detection systems (41, 42). The detection systems (41, 42) are arranged at a different optical distance from the radiation spot (11). With the aid of a partially transparent mirror (3), or in a different manner, it is ensured that the intensity distribution on the detection systems (41, 42) is uniform. A line (G) through the radiation spot (11) is constructed by determining the same characteristic point (G.sub.I, G.sub.II), for example, the point of gravity in the intensity distributions at different optical distances from the radiation spot (11). The height of the spot (11) and hence of the surface (21) is determined by means of this line.


Find Patent Forward Citations

Horijon, Joseph. (1994). Device for optically measuring the height of a surface (U.S. Patent No. 5329358). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5329358

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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