The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 12, 1994

Filed:

May. 21, 1992
Applicant:
Inventors:

David L Wright, Redwood City, CA (US);

John M Fleischer, San Jose, CA (US);

Assignee:

Photon, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J / ;
U.S. Cl.
CPC ...
356218 ; 356222 ; 356225 ; 356234 ; 359856 ; 359857 ;
Abstract

An optical system for the attenuation of laser light for measurement purposes which includes four logical subassemblies including a first attenuator subassembly for the attenuation of high power laser light, a second attenuator subassembly for lower power attenuation of the laser light, a third lens subassembly for collecting beam size data simultaneously at multiple locations in space, and a fourth logical subassembly including a beam measuring assembly for recording the beam size data received from the lens subassembly for analysis of the beam characteristics. The first attenuator subassembly is provided with a pair of reflecting, opposed facing, fixed wedges. The reflecting wedges are selectively tilted to eliminate interference effects between their inward facing reflecting surfaces. The second attenuator subassembly further includes a pair of opposed facing and movable wedges arranged in series with a fixed filter. The lens subassembly includes a positive optical lens for focusing the beam into a series of beam splitters which redirect the beam data for simultaneous collection on a beam measuring assembly. The beam measuring assembly preferably also includes a fixed filter disposed in front of the light collection surface.


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