The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 12, 1994

Filed:

Jul. 15, 1991
Applicant:
Inventors:

John R Viertl, Niskayuna, NY (US);

Fred R Burkhardt, Jr, Chesterfield, VA (US);

Assignee:

General Electric Company, Schenectady, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ; G01R / ;
U.S. Cl.
CPC ...
324262 ; 324226 ; 324238 ;
Abstract

An eddy current probe for detecting material flaws by inducing and measuring eddy currents in the surface of a material. The probe is held at a constant lift-off distance from the surface by a probe carriage that slides across the surface in a straight scan line. The carriage moves relative to a motorized bracket that slides the carriage across the surface. This relative movement allows the carriage to move across an uneven surface without deflecting the probe from a straight scan line. The probe has a split core so that an adjacent pair of coils project and detect electromagnetic fields on the surface being measured. Both coils have opposing flat sides that allow the coils to be closely packed together within the probe body.


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