The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 12, 1994

Filed:

Jul. 13, 1992
Applicant:
Inventor:

Nobuhiro Okano, Nara, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H05B / ;
U.S. Cl.
CPC ...
219209 ; 324537 ;
Abstract

The burn-in apparatus according to the present invention comprises a fixing unit for accommodating and fixing a plurality of semiconductor integrated devices and a unit for accommodating the fixing unit with the devices so as to keep a thermal condition therein. The fixing unit and the unit for accommodating the fixing unit are combined as one body to be carryable. The apparatus further comprises a unit for connecting the semiconductor integrated devices with a power supply disposed outside of the apparatus. When a burn-in test is conducted, the fixing unit and the unit for accommodating the fixing unit are combined as one body, and this combined body is fitted with a connector. After the burn-in test is finished, by detaching the unit for accommodating the fixing unit, the fixing unit can be used as trays for conveying the devices to the next test process.


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Okano, Nobuhiro. (1994). Burn-in apparatus for semiconductor integrated device (U.S. Patent No. 5329093). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5329093

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